“电迁移”造句
电迁移扩散是毛细管电泳中影响区带展宽的重要冈素之一.
Electromigration dispersion ( EMD ) is one of major effects on zone broadening in capillary electrophoresis.
另一方面, 电源网络上的大电流也可能导致芯片的
电迁移失效.
On the other hand, high supply flowing through the power grids may cause electromigration failures.
本文用测量电阻变化的方法,研究了Al-Si ( 1% ) 金属化线条的
电迁移失效.
The method of measuring metal stripresistance was used to investigate the elec - tromigration failure of Al - Si ( 1 % ) metalliza - tion.